Buffer-Layer Approach to High-Quality Fe3O4/BaTiO3 Thin Films on MgO

An innovative two-step thin film growth approach for complex oxide heterostructures was verified using transmission electron microscopy (TEM, see Figure below). An initial low temperature (1023 K) nucleation buffer layer of BaTiO3 (BTO) on high mismatch MgO substrate (~ 7% lattice misfit), was followed by a thicker BTO at higher temperature (1173 K), for subsequent growth of top magnetic Fe3O4 layer.

TEM studies show that most of the defects are accommodated by the initial BTO buffer, thereby relieving considerable strain in the second BTO layer. This facilitates smoother top (exposed) surface of BTO, which forms excellent epitaxy with Fe3O4, for further investigation of magneto-ferroelectric coupled phenomena.

Cube-on-cube orientation relations between various thin films and substrates:
[100]Fe3O4//[100]BaTiO3//[100]MgO and (010)Fe3O4//(010)BaTiO3//(010)MgO

 

Sujing Xie, G.E. Sterbinsky, Bruce Wessels and Vinayak P. Dravid

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The Materials Research Science and Engineering Center (MRSEC) is supported by the National Science Foundation under NSF Award Number DMR-0520513. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect those of the National Science Foundation.
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